Extension of the boundary-scan architecture and new idea of BIST for more effective testing and self-testing of interconnections - researchr publication

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Adam Kristof. Extension of the boundary-scan architecture and new idea of BIST for more effective testing and self-testing of interconnections. In European Design and Test Conference (ED&TC 97), Paris, France, 17-20 March 1997. pages 630, IEEE, 1997. [doi]

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