Sebastian Kropatschek, Oskar Gert, Iman Ayatollahi, Kristof Meixner, Elmar Kiesling, Alexander Steigberger, Arndt Lüder, Stefan Biffl. Designing a Digital Shadow for Efficient, Low-Delay Analysis of Production Quality Risk. In 27th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2022, Stuttgart, Germany, September 6-9, 2022. pages 1-8, IEEE, 2022. [doi]
Abstract is missing.