On Structural vs. Functional Testing for Delay Faults

Angela Krstic, Jing-Jia Liou, Kwang-Ting Cheng, Li-C. Wang. On Structural vs. Functional Testing for Delay Faults. In 4th International Symposium on Quality of Electronic Design (ISQED 2003), 24-26 March 2003, San Jose, CA, USA. pages 438-441, IEEE Computer Society, 2003. [doi]

Authors

Angela Krstic

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Jing-Jia Liou

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Kwang-Ting Cheng

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Li-C. Wang

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