Angela Krstic, Jing-Jia Liou, Kwang-Ting Cheng, Li-C. Wang. On Structural vs. Functional Testing for Delay Faults. In 4th International Symposium on Quality of Electronic Design (ISQED 2003), 24-26 March 2003, San Jose, CA, USA. pages 438-441, IEEE Computer Society, 2003. [doi]
@inproceedings{KrsticLCW03,
title = {On Structural vs. Functional Testing for Delay Faults},
author = {Angela Krstic and Jing-Jia Liou and Kwang-Ting Cheng and Li-C. Wang},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/isqed/2003/1881/00/18810438abs.htm},
tags = {testing, C++},
researchr = {https://researchr.org/publication/KrsticLCW03},
cites = {0},
citedby = {0},
pages = {438-441},
booktitle = {4th International Symposium on Quality of Electronic Design (ISQED 2003), 24-26 March 2003, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-1881-8},
}