Diagnosis of Delay Defects Using Statistical Timing Models - researchr publication

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Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-Jia Liou. Diagnosis of Delay Defects Using Statistical Timing Models. In 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA. pages 339-344, IEEE Computer Society, 2003. [doi]

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