Physical Design Solutions to Tackle FEOL/BEOL Degradation in Gate-level Monolithic 3D ICs - researchr publication authors

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Bon Woong Ku, Peter Debacker, Dragomir Milojevic, Praveen Raghavan, Diederik Verkest, Aaron Thean, Sung Kyu Lim. Physical Design Solutions to Tackle FEOL/BEOL Degradation in Gate-level Monolithic 3D ICs. In Proceedings of the 2016 International Symposium on Low Power Electronics and Design, ISLPED 2016, San Francisco Airport, CA, USA, August 08 - 10, 2016. pages 76-81, ACM, 2016. [doi]

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