Jerry C. Y. Ku, Ryan H.-M. Huang, Louis Y.-Z. Lin, Charles H.-P. Wen. Suppressing test inflation in shared-memory parallel Automatic Test Pattern Generation. In 19th Asia and South Pacific Design Automation Conference, ASP-DAC 2014, Singapore, January 20-23, 2014. pages 664-669, IEEE, 2014. [doi]
@inproceedings{KuHLW14,
title = {Suppressing test inflation in shared-memory parallel Automatic Test Pattern Generation},
author = {Jerry C. Y. Ku and Ryan H.-M. Huang and Louis Y.-Z. Lin and Charles H.-P. Wen},
year = {2014},
doi = {10.1109/ASPDAC.2014.6742967},
url = {http://dx.doi.org/10.1109/ASPDAC.2014.6742967},
researchr = {https://researchr.org/publication/KuHLW14},
cites = {0},
citedby = {0},
pages = {664-669},
booktitle = {19th Asia and South Pacific Design Automation Conference, ASP-DAC 2014, Singapore, January 20-23, 2014},
publisher = {IEEE},
}