Jerry C. Y. Ku, Ryan H.-M. Huang, Louis Y.-Z. Lin, Charles H.-P. Wen. Suppressing test inflation in shared-memory parallel Automatic Test Pattern Generation. In 19th Asia and South Pacific Design Automation Conference, ASP-DAC 2014, Singapore, January 20-23, 2014. pages 664-669, IEEE, 2014. [doi]
Abstract is missing.