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JExample: Exploiting Dependencies between Tests to Improve Defect Localization

Adrian Kuhn, Bart Van Rompaey, Lea Haensenberger, Oscar Nierstrasz, Serge Demeyer, Markus Gaelli, Koenraad Van Leemput. JExample: Exploiting Dependencies between Tests to Improve Defect Localization. In Pekka Abrahamsson, Richard Baskerville, Kieran Conboy, Brian Fitzgerald, Lorraine Morgan, Xiaofeng Wang, editors, Agile Processes in Software Engineering and Extreme Programming, 9th International Conference, XP 2008, Limerick, Ireland, June 10-14, 2008. Proceedings. Volume 9 of Lecture Notes in Business Information Processing, pages 73-82, Springer, 2008. [doi]

Authors

Adrian Kuhn

Identified as Adrian Kuhn
(University of Bern
)

Bart Van Rompaey

This author has not been identified. It may be one of the following persons: Look up 'Bart Van Rompaey' in Google

Lea Haensenberger

This author has not been identified. Look up 'Lea Haensenberger' in Google

Oscar Nierstrasz

Identified as Oscar Nierstrasz

Serge Demeyer

This author has not been identified. It may be one of the following persons: Look up 'Serge Demeyer' in Google

Markus Gälli

Identified as Markus Gaelli
(Methods in Action
)

Koenraad Van Leemput

This author has not been identified. Look up 'Koenraad Van Leemput' in Google
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