Adrian Kuhn, Bart Van Rompaey, Lea Haensenberger, Oscar Nierstrasz, Serge Demeyer, Markus Gaelli, Koenraad Van Leemput. JExample: Exploiting Dependencies between Tests to Improve Defect Localization. In Pekka Abrahamsson, Richard Baskerville, Kieran Conboy, Brian Fitzgerald, Lorraine Morgan, Xiaofeng Wang, editors, Agile Processes in Software Engineering and Extreme Programming, 9th International Conference, XP 2008, Limerick, Ireland, June 10-14, 2008. Proceedings. Volume 9 of Lecture Notes in Business Information Processing, pages 73-82, Springer, 2008. [doi]
@inproceedings{KuhnRHNDGL08,
title = {JExample: Exploiting Dependencies between Tests to Improve Defect Localization},
author = {Adrian Kuhn and Bart Van Rompaey and Lea Haensenberger and Oscar Nierstrasz and Serge Demeyer and Markus Gaelli and Koenraad Van Leemput},
year = {2008},
doi = {10.1007/978-3-540-68255-4_8},
url = {http://dx.doi.org/10.1007/978-3-540-68255-4_8},
tags = {testing},
researchr = {https://researchr.org/publication/KuhnRHNDGL08},
cites = {0},
citedby = {0},
pages = {73-82},
booktitle = {Agile Processes in Software Engineering and Extreme Programming, 9th International Conference, XP 2008, Limerick, Ireland, June 10-14, 2008. Proceedings},
editor = {Pekka Abrahamsson and Richard Baskerville and Kieran Conboy and Brian Fitzgerald and Lorraine Morgan and Xiaofeng Wang},
volume = {9},
series = {Lecture Notes in Business Information Processing},
publisher = {Springer},
isbn = {978-3-540-68254-7},
}