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Automated Fault Diagnostic EB Tester and Its Application to a 40K-Gate VLSI Circuit

Norio Kuji, Teruo Tamama. Automated Fault Diagnostic EB Tester and Its Application to a 40K-Gate VLSI Circuit. In Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985. pages 643-651, IEEE Computer Society, 1985.

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