A statistical framework for post-silicon tuning through body bias clustering

Sarvesh H. Kulkarni, Dennis Sylvester, David Blaauw. A statistical framework for post-silicon tuning through body bias clustering. In Soha Hassoun, editor, 2006 International Conference on Computer-Aided Design (ICCAD 06), November 5-9, 2006, San Jose, CA, USA. pages 39-46, ACM, 2006. [doi]

Abstract

Abstract is missing.