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Binod Kumar 0001, Jay Adhaduk, Kanad Basu, Masahiro Fujita, Virendra Singh. A Methodology to Capture Fine-Grained Internal Visibility During Multisession Silicon Debug. IEEE Trans. VLSI Syst., 28(4):1002-1015, 2020. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: A Methodology for SAT-Based Electrical Error Debugging During Post-Silicon ValidationBinod Kumar 0001, Masahiro Fujita, Virendra Singh. vlsid 2019: 389-394 [doi] Silicon Debug with Maximally Expanded Internal Observability Using Nearest Neighbor AlgorithmAnkit Jindal, Binod Kumar 0001, Nitish Jindal, Masahiro Fujita, Virendra Singh. isvlsi 2018: 46-51 [doi]
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