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Cross-Layer Reliability Modeling of Dual-Port FeFET: Device-Algorithm Interaction

Shubham Kumar, Swetaki Chatterjee, Simon Thomann, Yogesh Singh Chauhan, Hussam Amrouch. Cross-Layer Reliability Modeling of Dual-Port FeFET: Device-Algorithm Interaction. IEEE Trans. Circuits Syst. I Regul. Pap., 70(7):2891-2903, July 2023. [doi]

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Shubham Kumar

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Swetaki Chatterjee

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Simon Thomann

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Yogesh Singh Chauhan

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Hussam Amrouch

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