Shubham Kumar, Swetaki Chatterjee, Simon Thomann, Yogesh Singh Chauhan, Hussam Amrouch. Cross-Layer Reliability Modeling of Dual-Port FeFET: Device-Algorithm Interaction. IEEE Trans. Circuits Syst. I Regul. Pap., 70(7):2891-2903, July 2023. [doi]
Abstract is missing.