Shubham Kumar, Swetaki Chatterjee, Simon Thomann, Yogesh Singh Chauhan, Hussam Amrouch. Cross-Layer Reliability Modeling of Dual-Port FeFET: Device-Algorithm Interaction. IEEE Trans. Circuits Syst. I Regul. Pap., 70(7):2891-2903, July 2023. [doi]
@article{KumarCTCA23,
title = {Cross-Layer Reliability Modeling of Dual-Port FeFET: Device-Algorithm Interaction},
author = {Shubham Kumar and Swetaki Chatterjee and Simon Thomann and Yogesh Singh Chauhan and Hussam Amrouch},
year = {2023},
month = {July},
doi = {10.1109/TCSI.2023.3265427},
url = {https://doi.org/10.1109/TCSI.2023.3265427},
researchr = {https://researchr.org/publication/KumarCTCA23},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Circuits Syst. I Regul. Pap.},
volume = {70},
number = {7},
pages = {2891-2903},
}