SAT-based Silicon Debug of Electrical Errors under Restricted Observability Enhancement

Binod Kumar 0001, Masahiro Fujita, Virendra Singh. SAT-based Silicon Debug of Electrical Errors under Restricted Observability Enhancement. J. Electronic Testing, 35(5):655-678, 2019. [doi]

Authors

Binod Kumar 0001

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Masahiro Fujita

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Virendra Singh

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