Binod Kumar 0001, Masahiro Fujita, Virendra Singh. SAT-based Silicon Debug of Electrical Errors under Restricted Observability Enhancement. J. Electronic Testing, 35(5):655-678, 2019. [doi]
@article{KumarFS19,
title = {SAT-based Silicon Debug of Electrical Errors under Restricted Observability Enhancement},
author = {Binod Kumar 0001 and Masahiro Fujita and Virendra Singh},
year = {2019},
doi = {10.1007/s10836-019-05830-y},
url = {https://doi.org/10.1007/s10836-019-05830-y},
researchr = {https://researchr.org/publication/KumarFS19},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {35},
number = {5},
pages = {655-678},
}