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Impact of temperature variation on noise parameters and HCI degradation of Recessed Source/Drain Junctionless Gate All Around MOSFETs

Alok Kumar, Tarun Kumar Gupta, Bhavana P. Shrivastava, Abhinav Gupta. Impact of temperature variation on noise parameters and HCI degradation of Recessed Source/Drain Junctionless Gate All Around MOSFETs. Microelectronics Journal, 134:105720, April 2023. [doi]

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