Post-silicon observability enhancement with topology based trace signal selection - researchr publication authors

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Binod Kumar, Ankit Jindal, Masahiro Fujita, Virendra Singh. Post-silicon observability enhancement with topology based trace signal selection. In 18th IEEE Latin American Test Symposium, LATS 2017, Bogotá, Colombia, March 13-15, 2017. pages 1-6, IEEE, 2017. [doi]

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