Binod Kumar, Ankit Jindal, Masahiro Fujita, Virendra Singh. Post-silicon observability enhancement with topology based trace signal selection. In 18th IEEE Latin American Test Symposium, LATS 2017, Bogotá, Colombia, March 13-15, 2017. pages 1-6, IEEE, 2017. [doi]
@inproceedings{KumarJFS17,
title = {Post-silicon observability enhancement with topology based trace signal selection},
author = {Binod Kumar and Ankit Jindal and Masahiro Fujita and Virendra Singh},
year = {2017},
doi = {10.1109/LATW.2017.7906761},
url = {http://dx.doi.org/10.1109/LATW.2017.7906761},
researchr = {https://researchr.org/publication/KumarJFS17},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {18th IEEE Latin American Test Symposium, LATS 2017, Bogotá, Colombia, March 13-15, 2017},
publisher = {IEEE},
isbn = {978-1-5386-0415-1},
}