A Methodology for Trace Signal Selection to Improve Error Detection in Post-Silicon Validation - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Binod Kumar, Ankit Jindal, Virendra Singh, Masahiro Fujita. A Methodology for Trace Signal Selection to Improve Error Detection in Post-Silicon Validation. In 30th International Conference on VLSI Design and 16th International Conference on Embedded Systems, VLSID 2017, Hyderabad, India, January 7-11, 2017. pages 147-152, IEEE Computer Society, 2017. [doi]

This author has not been identified. Look up 'Binod Kumar' in GoogleThis author has not been identified. Look up 'Ankit Jindal' in GoogleThis author has not been identified. Look up 'Virendra Singh' in GoogleThis author has not been identified. Look up 'Masahiro Fujita' in Google

runs on WebDSL