Binod Kumar, Ankit Jindal, Virendra Singh, Masahiro Fujita. A Methodology for Trace Signal Selection to Improve Error Detection in Post-Silicon Validation. In 30th International Conference on VLSI Design and 16th International Conference on Embedded Systems, VLSID 2017, Hyderabad, India, January 7-11, 2017. pages 147-152, IEEE Computer Society, 2017. [doi]
Abstract is missing.