Customizing completely specified pattern set targeting dynamic and leakage power reduction during testing

S. Krishna Kumar, Subhadip Kundu, Santanu Chattopadhyay. Customizing completely specified pattern set targeting dynamic and leakage power reduction during testing. Integration, 45(2):211-221, 2012. [doi]

Authors

S. Krishna Kumar

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Subhadip Kundu

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Santanu Chattopadhyay

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