S. Krishna Kumar, Subhadip Kundu, Santanu Chattopadhyay. Customizing completely specified pattern set targeting dynamic and leakage power reduction during testing. Integration, 45(2):211-221, 2012. [doi]
@article{KumarKC12,
title = {Customizing completely specified pattern set targeting dynamic and leakage power reduction during testing},
author = {S. Krishna Kumar and Subhadip Kundu and Santanu Chattopadhyay},
year = {2012},
doi = {10.1016/j.vlsi.2011.08.001},
url = {http://dx.doi.org/10.1016/j.vlsi.2011.08.001},
researchr = {https://researchr.org/publication/KumarKC12},
cites = {0},
citedby = {0},
journal = {Integration},
volume = {45},
number = {2},
pages = {211-221},
}