A Probabilistic Collocation Method Based Statistical Gate Delay Model Considering Process Variations and Multiple Input Switching - researchr publication authors

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Y. Satish Kumar, Jun Li, Claudio Talarico, Janet Meiling Wang. A Probabilistic Collocation Method Based Statistical Gate Delay Model Considering Process Variations and Multiple Input Switching. In 2005 Design, Automation and Test in Europe Conference and Exposition (DATE 2005), 7-11 March 2005, Munich, Germany. pages 770-775, IEEE Computer Society, 2005. [doi]

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