Y. Satish Kumar, Jun Li, Claudio Talarico, Janet Meiling Wang. A Probabilistic Collocation Method Based Statistical Gate Delay Model Considering Process Variations and Multiple Input Switching. In 2005 Design, Automation and Test in Europe Conference and Exposition (DATE 2005), 7-11 March 2005, Munich, Germany. pages 770-775, IEEE Computer Society, 2005. [doi]
@inproceedings{KumarLTW05,
title = {A Probabilistic Collocation Method Based Statistical Gate Delay Model Considering Process Variations and Multiple Input Switching},
author = {Y. Satish Kumar and Jun Li and Claudio Talarico and Janet Meiling Wang},
year = {2005},
doi = {10.1109/DATE.2005.31},
url = {http://doi.ieeecomputersociety.org/10.1109/DATE.2005.31},
tags = {rule-based, process modeling},
researchr = {https://researchr.org/publication/KumarLTW05},
cites = {0},
citedby = {0},
pages = {770-775},
booktitle = {2005 Design, Automation and Test in Europe Conference and Exposition (DATE 2005), 7-11 March 2005, Munich, Germany},
publisher = {IEEE Computer Society},
isbn = {0-7695-2288-2},
}