Nitish Kumar, Aakanksha Mishra, Ankur Gupta, Pushpapraj Singh. Modeling of inner-outer gates and temperature dependent gate-induced drain leakage current of junctionless double-gate-all-around FET. Microelectronics Journal, 146:106155, 2024. [doi]
@article{KumarMGS24,
title = {Modeling of inner-outer gates and temperature dependent gate-induced drain leakage current of junctionless double-gate-all-around FET},
author = {Nitish Kumar and Aakanksha Mishra and Ankur Gupta and Pushpapraj Singh},
year = {2024},
doi = {10.1016/j.mejo.2024.106155},
url = {https://doi.org/10.1016/j.mejo.2024.106155},
researchr = {https://researchr.org/publication/KumarMGS24},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {146},
pages = {106155},
}