Chandan Kumar, Fadi Maamari, Kiran Vittal, Wilson Pradeep, Rajesh Tiwari, Srivaths Ravi. Methodology for Early RTL Testability and Coverage Analysis and Its Application to Industrial Designs. In 23rd IEEE Asian Test Symposium, ATS 2014, Hangzhou, China, November 16-19, 2014. pages 125-130, IEEE Computer Society, 2014. [doi]
Abstract is missing.