Quality Transition Fault Tests Suitable for Small Delay Defects - researchr publication related

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Mahilchi Milir Vaseekar Kumar, Spyros Tragoudas. Quality Transition Fault Tests Suitable for Small Delay Defects. In 23rd International Conference on Computer Design (ICCD 2005), 2-5 October 2005, San Jose, CA, USA. pages 468-470, IEEE Computer Society, 2005. [doi]

The following publications are possibly variants of this publication:

High-Quality Transition Fault ATPG for Small Delay DefectsMahilchi Milir Vaseekar Kumar, Spyros Tragoudas. tcad, 26(5):983-989, 2007. [doi]

Functions for Quality Transition Fault TestsMaria K. Michael, Stelios Neophytou, Spyros Tragoudas. isqed 2005: 327-332 [doi]

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