Akhil S. Kumar, Michael J. Uren, Matthew D. Smith 0003, Martin Kuball, Justin Parke, H. George Henry, Robert S. Howell. Dielectric Thickness and Fin Width Dependent OFF-State Degradation in AlGaN/GaN SLCFETs. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-4, IEEE, 2023. [doi]
Abstract is missing.