Sumeet S. Kumar, Amir Zjajo, Rene van Leuken. Physical characterization of steady-state temperature profiles in three-dimensional integrated circuits. In 2015 IEEE International Symposium on Circuits and Systems, ISCAS 2015, Lisbon, Portugal, May 24-27, 2015. pages 1969-1972, IEEE, 2015. [doi]
Abstract is missing.