Variability Investigation of Double Gate JunctionLess (DG-JL) Transistor for Circuit Design Perspective

Vandana Kumari, Manoj Saxena, Mridula Gupta. Variability Investigation of Double Gate JunctionLess (DG-JL) Transistor for Circuit Design Perspective. In Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh, editors, VLSI Design and Test - 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers. Volume 711 of Communications in Computer and Information Science, pages 496-503, Springer, 2017. [doi]

Authors

Vandana Kumari

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Manoj Saxena

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Mridula Gupta

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