Programmable At-Speed Array and Functional BIST for Embedded DRAM LSI - researchr publication authors

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Masaji Kume, Katsutoshi Uehara, Minoru Itakura, Hideo Sawamoto, Toru Kobayashi, Masatoshi Hasegawa, Hideki Hayashi. Programmable At-Speed Array and Functional BIST for Embedded DRAM LSI. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 988-996, IEEE, 2004. [doi]

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