Masaji Kume, Katsutoshi Uehara, Minoru Itakura, Hideo Sawamoto, Toru Kobayashi, Masatoshi Hasegawa, Hideki Hayashi. Programmable At-Speed Array and Functional BIST for Embedded DRAM LSI. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 988-996, IEEE, 2004. [doi]
@inproceedings{KumeUISKHH04,
title = {Programmable At-Speed Array and Functional BIST for Embedded DRAM LSI},
author = {Masaji Kume and Katsutoshi Uehara and Minoru Itakura and Hideo Sawamoto and Toru Kobayashi and Masatoshi Hasegawa and Hideki Hayashi},
year = {2004},
doi = {10.1109/ITC.2004.146},
url = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.146},
tags = {functional programming},
researchr = {https://researchr.org/publication/KumeUISKHH04},
cites = {0},
citedby = {0},
pages = {988-996},
booktitle = {Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA},
publisher = {IEEE},
isbn = {0-7803-8581-0},
}