Fault diagnosis in designs with extreme low pin test data compressors - researchr publication authors

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Subhadip Kundu, Parthajit Bhattacharya, Rohit Kapur. Fault diagnosis in designs with extreme low pin test data compressors. In Wolfgang Nebel, David Atienza, editors, Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015. pages 1285-1288, ACM, 2015. [doi]

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