Subhadip Kundu, Parthajit Bhattacharya, Rohit Kapur. Fault diagnosis in designs with extreme low pin test data compressors. In Wolfgang Nebel, David Atienza, editors, Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015. pages 1285-1288, ACM, 2015. [doi]
No references recorded for this publication.
No citations of this publication recorded.