Subhadip Kundu, Parthajit Bhattacharya, Rohit Kapur. Fault diagnosis in designs with extreme low pin test data compressors. In Wolfgang Nebel, David Atienza, editors, Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015. pages 1285-1288, ACM, 2015. [doi]
@inproceedings{KunduBK15,
title = {Fault diagnosis in designs with extreme low pin test data compressors},
author = {Subhadip Kundu and Parthajit Bhattacharya and Rohit Kapur},
year = {2015},
url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=7092590},
researchr = {https://researchr.org/publication/KunduBK15},
cites = {0},
citedby = {0},
pages = {1285-1288},
booktitle = {Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015},
editor = {Wolfgang Nebel and David Atienza},
publisher = {ACM},
isbn = {978-3-9815370-4-8},
}