Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur. Scan Chain Masking for Diagnosis of Multiple Chain Failures in a Space Compaction Environment. IEEE Trans. VLSI Syst., 23(7):1185-1195, 2015. [doi]
@article{KunduCSK15,
title = {Scan Chain Masking for Diagnosis of Multiple Chain Failures in a Space Compaction Environment},
author = {Subhadip Kundu and Santanu Chattopadhyay and Indranil Sengupta and Rohit Kapur},
year = {2015},
doi = {10.1109/TVLSI.2014.2333691},
url = {http://dx.doi.org/10.1109/TVLSI.2014.2333691},
researchr = {https://researchr.org/publication/KunduCSK15},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {23},
number = {7},
pages = {1185-1195},
}