Sandip Kundu, Piet Engelke, Ilia Polian, Bernd Becker. On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India. pages 266-271, IEEE Computer Society, 2005. [doi]
@inproceedings{KunduEPB05,
title = {On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing},
author = {Sandip Kundu and Piet Engelke and Ilia Polian and Bernd Becker},
year = {2005},
doi = {10.1109/ATS.2005.83},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2005.83},
tags = {testing},
researchr = {https://researchr.org/publication/KunduEPB05},
cites = {0},
citedby = {0},
pages = {266-271},
booktitle = {14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India},
publisher = {IEEE Computer Society},
isbn = {0-7695-2481-8},
}