On the design of robust testable CMOS combinational logic circuits

Sandip Kundu, Sudhakar M. Reddy. On the design of robust testable CMOS combinational logic circuits. In Proceedings of the Eighteenth International Symposium on Fault-Tolerant Computing, FTCS 1988, Tokyo, Japan, 27-30 June, 1988. pages 220-225, IEEE Computer Society, 1988. [doi]

Abstract

Abstract is missing.