Sandip Kundu, Sudhakar M. Reddy, Niraj K. Jha. On the design of robust multiple fault testable CMOS combinational logic circuits. In 1988 IEEE International Conference on Computer-Aided Design, ICCAD 1988, Santa Clara, CA, USA, November 7-10, 1988. Digest of Technical Papers. pages 240-243, IEEE, 1988. [doi]
Abstract is missing.