Test challenges in nanometer technologies

Sandip Kundu, Sanjay Sengupta, Rajesh Galivanche. Test challenges in nanometer technologies. In 5th European Test Workshop, ETW 2000, Cascais, Portugal, May 23-26, 2000. pages 83-90, IEEE Computer Society, 2000. [doi]

Authors

Sandip Kundu

This author has not been identified. Look up 'Sandip Kundu' in Google

Sanjay Sengupta

This author has not been identified. Look up 'Sanjay Sengupta' in Google

Rajesh Galivanche

This author has not been identified. Look up 'Rajesh Galivanche' in Google