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Sandip Kundu, Sanjay Sengupta, Rajesh Galivanche. Test challenges in nanometer technologies. In 5th European Test Workshop, ETW 2000, Cascais, Portugal, May 23-26, 2000. pages 83-90, IEEE Computer Society, 2000. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Test Challenges in Nanometer TechnologiesSandip Kundu, Sujit T. Zachariah, Sanjay Sengupta, Rajesh Galivanche. et, 17(3-4):209-218, 2001. [doi] Test Strategies for Nanometer TechnologiesSanjay Sengupta. itc 2003: 1421 [doi]
The following publications are possibly variants of this publication: