Yield Ramp up by Scan Chain Diagnosis

Feng-Ming Kuo, Yuan-Shih Chen. Yield Ramp up by Scan Chain Diagnosis. In Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan. pages 94-95, IEEE Computer Society, 2009. [doi]

Authors

Feng-Ming Kuo

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Yuan-Shih Chen

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