Detailed Comparisons of Program, Erase and Data Retention Characteristics between P+- and N+-Poly SONOS NAND Flash Memory - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Victor Chao-Wei Kuo, Chih-Ming Chao, Chih-Kai Kang, Li-Wei Liu, Tzung-Bin Huang, Liang-Tai Kuo, Shi-Hsien Chen, Houng-Chi Wei, Hann-Ping Hwang, Saysamone Pittikoun. Detailed Comparisons of Program, Erase and Data Retention Characteristics between P+- and N+-Poly SONOS NAND Flash Memory. In 14th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2006), 2-4 August 2006, Taipei, Taiwan. pages 77-79, IEEE Computer Society, 2006. [doi]

This author has not been identified. Look up 'Victor Chao-Wei Kuo' in GoogleThis author has not been identified. Look up 'Chih-Ming Chao' in GoogleThis author has not been identified. Look up 'Chih-Kai Kang' in GoogleThis author has not been identified. Look up 'Li-Wei Liu' in GoogleThis author has not been identified. Look up 'Tzung-Bin Huang' in GoogleThis author has not been identified. Look up 'Liang-Tai Kuo' in GoogleThis author has not been identified. Look up 'Shi-Hsien Chen' in GoogleThis author has not been identified. Look up 'Houng-Chi Wei' in GoogleThis author has not been identified. Look up 'Hann-Ping Hwang' in GoogleThis author has not been identified. Look up 'Saysamone Pittikoun' in Google

runs on WebDSL