Victor Chao-Wei Kuo, Chih-Ming Chao, Chih-Kai Kang, Li-Wei Liu, Tzung-Bin Huang, Liang-Tai Kuo, Shi-Hsien Chen, Houng-Chi Wei, Hann-Ping Hwang, Saysamone Pittikoun. Detailed Comparisons of Program, Erase and Data Retention Characteristics between P+- and N+-Poly SONOS NAND Flash Memory. In 14th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2006), 2-4 August 2006, Taipei, Taiwan. pages 77-79, IEEE Computer Society, 2006. [doi]
@inproceedings{KuoCKLHKCWHP06,
title = {Detailed Comparisons of Program, Erase and Data Retention Characteristics between P+- and N+-Poly SONOS NAND Flash Memory},
author = {Victor Chao-Wei Kuo and Chih-Ming Chao and Chih-Kai Kang and Li-Wei Liu and Tzung-Bin Huang and Liang-Tai Kuo and Shi-Hsien Chen and Houng-Chi Wei and Hann-Ping Hwang and Saysamone Pittikoun},
year = {2006},
doi = {10.1109/MTDT.2006.10},
url = {http://doi.ieeecomputersociety.org/10.1109/MTDT.2006.10},
tags = {data-flow programming},
researchr = {https://researchr.org/publication/KuoCKLHKCWHP06},
cites = {0},
citedby = {0},
pages = {77-79},
booktitle = {14th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2006), 2-4 August 2006, Taipei, Taiwan},
publisher = {IEEE Computer Society},
isbn = {0-7695-2572-5},
}