Jun-Hua Kuo, Ting-Shuo Hsu, Jing-Jia Liou. Test Cost Reduction for Performance Yield Recovery by Classification of Multiple-Clock Test Data. In 21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012. pages 320-325, IEEE Computer Society, 2012. [doi]
@inproceedings{KuoHL12-1,
title = {Test Cost Reduction for Performance Yield Recovery by Classification of Multiple-Clock Test Data},
author = {Jun-Hua Kuo and Ting-Shuo Hsu and Jing-Jia Liou},
year = {2012},
doi = {10.1109/ATS.2012.54},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2012.54},
researchr = {https://researchr.org/publication/KuoHL12-1},
cites = {0},
citedby = {0},
pages = {320-325},
booktitle = {21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-4555-2},
}