Jun-Hua Kuo, Ting-Shuo Hsu, Jing-Jia Liou. Test Cost Reduction for Performance Yield Recovery by Classification of Multiple-Clock Test Data. In 21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012. pages 320-325, IEEE Computer Society, 2012. [doi]
Abstract is missing.