Cheng-Sian Kuo, Bing-Han Hsieh, James Chien-Mo Li, Chris Nigh, Gaurav Bhargava, Mason Chern. Diagnosing Double Faulty Chains through Failing Bit Separation. In IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022. pages 175-184, IEEE, 2022. [doi]
Abstract is missing.